Keithley 2636 Low Level free download

File name 2636 Low Level.pdf

A G R E AT E R M E A S U R E O F C O N F I D E N C E offsets and drift in voltage readings. In the past, it would have been possible to simply increase the test current until the DUT's re- sponse voltage was much larger than these errors, but with today's smaller devices this is no longer an option. Increased test cur- rent can cause device heating, changing the device's resistance, or even destroy the de- vice. The key to obtaining accurate, consis- tent measurements is eliminating the error. For low-voltage measurement applications, such error is composed largely of white noise (random noise across all frequencies) and 1/f noise. Thermoelectric voltages (typically Low-Voltage having 1/f distribution) are generated from temperature differences in the circuit. Resistance is calculated using Ohm's Measurement Law; that is, the DC voltage measured